Geochemistry: Exploration, Environment, Analysis (GEEA) is a co-owned journal of the Geological Society of London and the Association of Applied Geochemists (AAG).
The Association of Applied Geochemists (AAG) and the Geological Society of London (GSL) are seeking to fill the position of Editor-in-Chief of their co-owned journal, Geochemistry: Exploration, Environment, Analysis (GEEA), early in 2015.
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GEEA focuses on mineral exploration using geochemistry; related fields also covered include geoanalysis, the development of methods and techniques used to analyse geochemical materials such as rocks, soils,
sediments, waters and vegetation, and environmental issues associated with mining and source apportionment. The journal is well known for its special issues on hot topics, the current one being the application of portable X-ray fluorescence in the geosciences.
GEEA regularly publishes papers from the biennial International Applied Geochemistry Symposium (IAGS).
Papers that seek to integrate geological, geochemical and geophysical methods of exploration are particularly welcome, as are those that concern geochemical mapping and those that comprise case histories. Given the many links between exploration and environmental geochemistry, the journal encourages the exchange of concepts and data; in particular, to differentiate various sources of elements.
GEEA publishes research articles; discussion papers; book reviews; editorial content; thematic sets.
The Chief Editor Gwendy Hall (Geological Survey of Canada) is supported by an international editorial board.
Online in the Lyell Collection
The journal is in the Lyell Collection and papers appear Online First soon after they have been accepted for publication and ahead of the printed issue. The journal is easily accessible on mobile devices.
The journal is published in print in February, May, August and November.
The journal is abstracted and/or indexed in:
- AGI’s Bibliography and Index of Geology
- Chemical Abstracts
- Current Contents
- Engineering Index
- Mineralogical Abstracts
- Thomson ISI database (SCIE, CCIPC & ES)